Menu
Home
Products
ATE Portfolio
Mems Solution
Mixed Signals
Power Device Testing
Burn-in & HTOL Solution
Handlers
Kronos AI ENABLED
Services
Test services
ASIC design & Special Applications
Training
Company
About us
Microtest Group
Mission & Vision
History
Headquarters
Sustainability
Suppliers Code of Conduct
Code of Ethics
Certifications
Model O.G.C. 231/01
Portfolio
Testimonials
Global footprint
Careers
News
Events
Content Hub
Semiconductor Testing
Revolutionizing Burn-In Testing
KGD testing solutions
ASIC DESIGN – Discover the Process
Kronos AI ENABLED
Contacts
Menu
en
it
中文
Search
Search
Home
Testimonial
Testimonial
Login
Email
I accept the
statement on disclosure of personal data
You must accept the terms and conditions to proceed.
This site is registered on
wpml.org
as a development site. Switch to a production site key to
remove this banner
.