{"id":12337,"date":"2024-12-04T09:00:30","date_gmt":"2024-12-04T08:00:30","guid":{"rendered":"https:\/\/www.microtest.net\/microtest-group-at-semicon-japan\/"},"modified":"2024-12-04T09:00:32","modified_gmt":"2024-12-04T08:00:32","slug":"microtest-group-at-semicon-japan","status":"publish","type":"post","link":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/","title":{"rendered":"Microtest Group at SEMICON Japan"},"content":{"rendered":"

\"\"<\/p>\n

Microtest Group<\/strong> is pleased to announce its participation in SEMICON Japan<\/strong> 2024, one of the most prominent events in the semiconductor manufacturing supply chain, which will take place from December 11 to 13, 2024, at Tokyo Big Sight, Japan.<\/p>\n

This year\u2019s SEMICON Japan will focus on Smart applications, including automotive technologies and the Internet of Things (IoT), reflecting the crucial role of semiconductors in driving digital transformation across industries.<\/p>\n

Leveraging 25 years of advanced performance, high parallelism, and pioneering automation, Microtest Group will be showcasing its expertise in Automatic Test Equipment (ATE)<\/strong> and semiconductor testing solutions.<\/p>\n

Our team will be at Booth 2126 to present our latest advancements and discuss how Microtest Group\u2019s expertise can support you. You can also find us in the Italy Pavillon, Hall 7, stand 7315.<\/p>\n

Make also sure to visit our distributor ATE Service at booth 2040, Hall 2.<\/p>\n

See you in Tokyo!<\/strong><\/p>\n","protected":false},"excerpt":{"rendered":"

Microtest Group is p […]<\/p>\n","protected":false},"author":1,"featured_media":12332,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[30],"tags":[],"class_list":["post-12337","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news-zh-hans"],"acf":[],"yoast_head":"\nMicrotest Group at SEMICON Japan - Microtest - Automatic Test Equipment | Breakthrough Innovation<\/title>\n<meta name=\"robots\" content=\"noindex, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<meta property=\"og:locale\" content=\"zh_CN\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Microtest Group at SEMICON Japan - Microtest - Automatic Test Equipment | Breakthrough Innovation\" \/>\n<meta property=\"og:description\" content=\"Microtest Group is p […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/\" \/>\n<meta property=\"og:site_name\" content=\"Microtest - Automatic Test Equipment | Breakthrough Innovation\" \/>\n<meta property=\"article:published_time\" content=\"2024-12-04T08:00:30+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2024-12-04T08:00:32+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/microdev.filanda.it\/wp-content\/uploads\/2024\/12\/scj2024_600x600_en.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"600\" \/>\n\t<meta property=\"og:image:height\" content=\"600\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Microtest\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"\u4f5c\u8005\" \/>\n\t<meta name=\"twitter:data1\" content=\"Microtest\" \/>\n\t<meta name=\"twitter:label2\" content=\"\u9884\u8ba1\u9605\u8bfb\u65f6\u95f4\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 \u5206\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/\",\"url\":\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/\",\"name\":\"Microtest Group at SEMICON Japan - Microtest - Automatic Test Equipment | Breakthrough Innovation\",\"isPartOf\":{\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#primaryimage\"},\"image\":{\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/microdev.filanda.it\/wp-content\/uploads\/2024\/12\/scj2024_600x600_en.jpg\",\"datePublished\":\"2024-12-04T08:00:30+00:00\",\"dateModified\":\"2024-12-04T08:00:32+00:00\",\"author\":{\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/#\/schema\/person\/5323da3ef5c9afa47e76c4c7a71f2df1\"},\"breadcrumb\":{\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#breadcrumb\"},\"inLanguage\":\"zh-Hans\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"zh-Hans\",\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#primaryimage\",\"url\":\"https:\/\/microdev.filanda.it\/wp-content\/uploads\/2024\/12\/scj2024_600x600_en.jpg\",\"contentUrl\":\"https:\/\/microdev.filanda.it\/wp-content\/uploads\/2024\/12\/scj2024_600x600_en.jpg\",\"width\":600,\"height\":600},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/microdev.filanda.it\/zh-hans\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Microtest Group at SEMICON Japan\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/#website\",\"url\":\"https:\/\/microdev.filanda.it\/zh-hans\/\",\"name\":\"Microtest - Automatic Test Equipment | Breakthrough Innovation\",\"description\":\"Automatic Test Equipment | Breakthrough Innovation\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/microdev.filanda.it\/zh-hans\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"zh-Hans\"},{\"@type\":\"Person\",\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/#\/schema\/person\/5323da3ef5c9afa47e76c4c7a71f2df1\",\"name\":\"Microtest\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"zh-Hans\",\"@id\":\"https:\/\/microdev.filanda.it\/zh-hans\/#\/schema\/person\/image\/\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/6d57d5f43c2a5e1a396c2b9d0949db2625c4b37ffac8784f121858b2197c05eb?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/6d57d5f43c2a5e1a396c2b9d0949db2625c4b37ffac8784f121858b2197c05eb?s=96&d=mm&r=g\",\"caption\":\"Microtest\"},\"sameAs\":[\"https:\/\/www.microtest.net\"]}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Microtest Group at SEMICON Japan - Microtest - Automatic Test Equipment | Breakthrough Innovation","robots":{"index":"noindex","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"og_locale":"zh_CN","og_type":"article","og_title":"Microtest Group at SEMICON Japan - Microtest - Automatic Test Equipment | Breakthrough Innovation","og_description":"Microtest Group is p […]","og_url":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/","og_site_name":"Microtest - Automatic Test Equipment | Breakthrough Innovation","article_published_time":"2024-12-04T08:00:30+00:00","article_modified_time":"2024-12-04T08:00:32+00:00","og_image":[{"width":600,"height":600,"url":"https:\/\/microdev.filanda.it\/wp-content\/uploads\/2024\/12\/scj2024_600x600_en.jpg","type":"image\/jpeg"}],"author":"Microtest","twitter_card":"summary_large_image","twitter_misc":{"\u4f5c\u8005":"Microtest","\u9884\u8ba1\u9605\u8bfb\u65f6\u95f4":"1 \u5206"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/","url":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/","name":"Microtest Group at SEMICON Japan - Microtest - Automatic Test Equipment | Breakthrough Innovation","isPartOf":{"@id":"https:\/\/microdev.filanda.it\/zh-hans\/#website"},"primaryImageOfPage":{"@id":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#primaryimage"},"image":{"@id":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#primaryimage"},"thumbnailUrl":"https:\/\/microdev.filanda.it\/wp-content\/uploads\/2024\/12\/scj2024_600x600_en.jpg","datePublished":"2024-12-04T08:00:30+00:00","dateModified":"2024-12-04T08:00:32+00:00","author":{"@id":"https:\/\/microdev.filanda.it\/zh-hans\/#\/schema\/person\/5323da3ef5c9afa47e76c4c7a71f2df1"},"breadcrumb":{"@id":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#breadcrumb"},"inLanguage":"zh-Hans","potentialAction":[{"@type":"ReadAction","target":["https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/"]}]},{"@type":"ImageObject","inLanguage":"zh-Hans","@id":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#primaryimage","url":"https:\/\/microdev.filanda.it\/wp-content\/uploads\/2024\/12\/scj2024_600x600_en.jpg","contentUrl":"https:\/\/microdev.filanda.it\/wp-content\/uploads\/2024\/12\/scj2024_600x600_en.jpg","width":600,"height":600},{"@type":"BreadcrumbList","@id":"https:\/\/microdev.filanda.it\/zh-hans\/microtest-group-at-semicon-japan\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/microdev.filanda.it\/zh-hans\/"},{"@type":"ListItem","position":2,"name":"Microtest Group at SEMICON Japan"}]},{"@type":"WebSite","@id":"https:\/\/microdev.filanda.it\/zh-hans\/#website","url":"https:\/\/microdev.filanda.it\/zh-hans\/","name":"Microtest - Automatic Test Equipment | Breakthrough Innovation","description":"Automatic Test Equipment | Breakthrough Innovation","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/microdev.filanda.it\/zh-hans\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"zh-Hans"},{"@type":"Person","@id":"https:\/\/microdev.filanda.it\/zh-hans\/#\/schema\/person\/5323da3ef5c9afa47e76c4c7a71f2df1","name":"Microtest","image":{"@type":"ImageObject","inLanguage":"zh-Hans","@id":"https:\/\/microdev.filanda.it\/zh-hans\/#\/schema\/person\/image\/","url":"https:\/\/secure.gravatar.com\/avatar\/6d57d5f43c2a5e1a396c2b9d0949db2625c4b37ffac8784f121858b2197c05eb?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/6d57d5f43c2a5e1a396c2b9d0949db2625c4b37ffac8784f121858b2197c05eb?s=96&d=mm&r=g","caption":"Microtest"},"sameAs":["https:\/\/www.microtest.net"]}]}},"_links":{"self":[{"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/posts\/12337","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/comments?post=12337"}],"version-history":[{"count":2,"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/posts\/12337\/revisions"}],"predecessor-version":[{"id":12475,"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/posts\/12337\/revisions\/12475"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/media\/12332"}],"wp:attachment":[{"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/media?parent=12337"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/categories?post=12337"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/microdev.filanda.it\/zh-hans\/wp-json\/wp\/v2\/tags?post=12337"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}